| 1996 |
|---|
| 7 | | Weiwei Mao,
Ravi K. Gulati:
Improving Gate Level Fault Coverage by RTL Fault Grading.
ITC 1996: 150-159 |
| 1994 |
|---|
| 6 | | Yunsheng Lu,
Weiwei Mao,
Ramaswami Dandapani,
Ravi K. Gulati:
Structure and Metrology for a Single-wire Analog.
ITC 1994: 919-928 |
| 1992 |
|---|
| 5 | | Ravi K. Gulati,
Weiwei Mao,
Deepak K. Goel:
Detection of "Undetectable" Faults Using IDDQ Testing.
ITC 1992: 770-777 |
| 4 | EE | Ravi K. Gulati,
Charles F. Hawkins:
Introduction.
J. Electronic Testing 3(4): 289 (1992) |
| 3 | EE | Jerry M. Soden,
Charles F. Hawkins,
Ravi K. Gulati,
Weiwei Mao:
IDDQ testing: A review.
J. Electronic Testing 3(4): 291-303 (1992) |
| 2 | EE | Weiwei Mao,
Ravi K. Gulati:
Quietest: A methodology for selecting IDDQ test vectors.
J. Electronic Testing 3(4): 349-357 (1992) |
| 1990 |
|---|
| 1 | | Weiwei Mao,
Ravi K. Gulati,
Deepak K. Goel,
Michael D. Ciletti:
QUIETEST: A Quiescent Current Testing Methodology for Detecting Leakage Faults.
ICCAD 1990: 280-283 |
