| |
| 2003 | ||
|---|---|---|
| 2 | EE | Paiboon Tangyunyong: Thermal modeling of localized laser heating in multi-level interconnects. Microelectronics Reliability 43(2): 297-305 (2003) |
| 1997 | ||
| 1 | Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins: Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. ITC 1997: 23-31 | |
| 1 | Daniel L. Barton | [1] |
| 2 | Richard W. Beegle | [1] |
| 3 | Patrick L. Candelaria | [1] |
| 4 | Edward I. Cole Jr. | [1] |
| 5 | Charles F. Hawkins | [1] |
| 6 | Christopher L. Henderson | [1] |
| 7 | Jerry M. Soden | [1] |