| 1998 |
|---|
| 6 | EE | Alan W. Righter,
Charles F. Hawkins,
Jerry M. Soden,
Peter C. Maxwell:
CMOS IC reliability indicators and burn-in economics.
ITC 1998: 194-203 |
| 1997 |
|---|
| 5 | | J. S. Beasley,
S. Pour-Mozafari,
D. Huggett,
Alan W. Righter,
C. J. Apodaca:
iDD Pulse Response Testing Applied to Complex CMOS ICs.
ITC 1997: 32-39 |
| 1996 |
|---|
| 4 | | Alan W. Righter,
Jerry M. Soden,
Richard W. Beegle:
High Resolution IDDQ Characterization and Testing - Practical Issues.
ITC 1996: 259-268 |
| 1995 |
|---|
| 3 | | Alan W. Righter:
Solving Known Good Die (and Substrate) Test Issues.
ITC 1995: 916 |
| 1994 |
|---|
| 2 | | Charles F. Hawkins,
Jerry M. Soden,
Alan W. Righter,
F. Joel Ferguson:
Defect Classes - An Overdue Paradigm for CMOS IC.
ITC 1994: 413-425 |
| 1993 |
|---|
| 1 | | Kenneth M. Wallquist,
Alan W. Righter,
Charles F. Hawkins:
A General Purpose IDDQ Measurement Circuit.
ITC 1993: 642-651 |
