Ted Dellin
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1999
1
EE
Charles F. Hawkins
,
Jaume Segura
,
Jerry M. Soden
, Ted Dellin: Test and Reliability: Partners in IC Manufacturing, Part 2.
IEEE Design & Test of Computers 16
(4): 66-73 (1999)
Coauthor
Index
1
Charles F. Hawkins
[
1
]
2
Jaume Segura
[
1
]
3
Jerry M. Soden
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)