Edward I. Cole Jr.

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3EEEdward I. Cole Jr.: Global Failure Localization: We Have To, But on What and How?. ITC 2004: 1440
2EEEdward I. Cole Jr.: Global fault localization using induced voltage alteration. Microelectronics Reliability 41(8): 1145-1159 (2001)
1 Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins: Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. ITC 1997: 23-31

Coauthor Index

1Daniel L. Barton [1]
2Richard W. Beegle [1]
3Patrick L. Candelaria [1]
4Charles F. Hawkins [1]
5Christopher L. Henderson [1]
6Jerry M. Soden [1]
7Paiboon Tangyunyong [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)