| |
| 2004 | ||
|---|---|---|
| 3 | EE | Edward I. Cole Jr.: Global Failure Localization: We Have To, But on What and How?. ITC 2004: 1440 |
| 2001 | ||
| 2 | EE | Edward I. Cole Jr.: Global fault localization using induced voltage alteration. Microelectronics Reliability 41(8): 1145-1159 (2001) |
| 1997 | ||
| 1 | Edward I. Cole Jr., Jerry M. Soden, Paiboon Tangyunyong, Patrick L. Candelaria, Richard W. Beegle, Daniel L. Barton, Christopher L. Henderson, Charles F. Hawkins: Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects. ITC 1997: 23-31 | |
| 1 | Daniel L. Barton | [1] |
| 2 | Richard W. Beegle | [1] |
| 3 | Patrick L. Candelaria | [1] |
| 4 | Charles F. Hawkins | [1] |
| 5 | Christopher L. Henderson | [1] |
| 6 | Jerry M. Soden | [1] |
| 7 | Paiboon Tangyunyong | [1] |