| 1999 |
|---|
| 3 | | Richard W. Beegle,
Robert W. Brocato,
Ronald W. Grant:
IMEMS accelerometer testing-test laboratory development and usage.
ITC 1999: 338-347 |
| 1997 |
|---|
| 2 | | Edward I. Cole Jr.,
Jerry M. Soden,
Paiboon Tangyunyong,
Patrick L. Candelaria,
Richard W. Beegle,
Daniel L. Barton,
Christopher L. Henderson,
Charles F. Hawkins:
Transient Power Supply Voltage (VDDT) Analysis for Detecting IC Defects.
ITC 1997: 23-31 |
| 1996 |
|---|
| 1 | | Alan W. Righter,
Jerry M. Soden,
Richard W. Beegle:
High Resolution IDDQ Characterization and Testing - Practical Issues.
ITC 1996: 259-268 |
