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1997 | ||
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1 | Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa: Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC 1997: 489-498 |
1 | Rodney A. Browen | [1] |
2 | Katsuhiro Hirayama | [1] |
3 | Akira Matsuzawa | [1] |
4 | John E. McDermid | [1] |
5 | Kenneth P. Parker | [1] |