Katsuhiro Hirayama

1997
2	EE	Takaki Yoshida, Reisuke Shimoda, Takashi Mizokawa, Katsuhiro Hirayama: An effective fault simulation method for core based LSI. Asian Test Symposium 1997: 116-121
1		Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa: Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC 1997: 489-498

Coauthor Index

1	Rodney A. Browen	[1]
2	Akira Matsuzawa	[1]
3	John E. McDermid	[1]
4	Takashi Mizokawa	[2]
5	Kozo Nuriya	[1]
6	Kenneth P. Parker	[1]
7	Reisuke Shimoda	[2]
8	Takaki Yoshida	[2]

Colors in the list of coauthors