| |
| 1997 | ||
|---|---|---|
| 2 | Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa: Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC 1997: 489-498 | |
| 1993 | ||
| 1 | Kenneth P. Parker, John E. McDermid, Stig Oresjo: Structure and Metrology for an Analog Testability Bus. ITC 1993: 309-322 | |
| 1 | Rodney A. Browen | [2] |
| 2 | Katsuhiro Hirayama | [2] |
| 3 | Akira Matsuzawa | [2] |
| 4 | Kozo Nuriya | [2] |
| 5 | Stig Oresjo | [1] |
| 6 | Kenneth P. Parker | [1] [2] |