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John E. McDermid

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1997
2 Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa: Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC 1997: 489-498
1993
1 Kenneth P. Parker, John E. McDermid, Stig Oresjo: Structure and Metrology for an Analog Testability Bus. ITC 1993: 309-322

Coauthor Index

1Rodney A. Browen [2]
2Katsuhiro Hirayama [2]
3Akira Matsuzawa [2]
4Kozo Nuriya [2]
5Stig Oresjo [1]
6Kenneth P. Parker [1] [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)