| |
| 1997 | ||
|---|---|---|
| 1 | Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa: Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC 1997: 489-498 | |
| 1 | Katsuhiro Hirayama | [1] |
| 2 | Akira Matsuzawa | [1] |
| 3 | John E. McDermid | [1] |
| 4 | Kozo Nuriya | [1] |
| 5 | Kenneth P. Parker | [1] |