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W. Reohr

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2009
1EERouwaida Kanj, Rajiv V. Joshi, Jente B. Kuang, J. Kim, Mesut Meterelliyoz, W. Reohr, Sani R. Nassif, Kevin J. Nowka: Statistical yield analysis of silicon-on-insulator embedded DRAM. ISQED 2009: 190-194

Coauthor Index

1Rajiv V. Joshi [1]
2Rouwaida Kanj [1]
3J. Kim [1]
4Jente B. Kuang [1]
5Mesut Meterelliyoz [1]
6Sani R. Nassif [1]
7Kevin J. Nowka [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)