| |
| 2009 | ||
|---|---|---|
| 1 | EE | Rouwaida Kanj, Rajiv V. Joshi, Jente B. Kuang, J. Kim, Mesut Meterelliyoz, W. Reohr, Sani R. Nassif, Kevin J. Nowka: Statistical yield analysis of silicon-on-insulator embedded DRAM. ISQED 2009: 190-194 |
| 1 | Rajiv V. Joshi | [1] |
| 2 | Rouwaida Kanj | [1] |
| 3 | J. Kim | [1] |
| 4 | Jente B. Kuang | [1] |
| 5 | Mesut Meterelliyoz | [1] |
| 6 | Sani R. Nassif | [1] |
| 7 | Kevin J. Nowka | [1] |