| |
| 2007 | ||
|---|---|---|
| 1 | EE | Rouwaida Kanj, Rajiv V. Joshi, Jayakumaran Sivagnaname, Jente B. Kuang, Dhruva Acharyya, Tuyet Nguyen, Chandler McDowell, Sani R. Nassif: Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs. ISQED 2007: 33-40 |
| 1 | Dhruva Acharyya | [1] |
| 2 | Rajiv V. Joshi | [1] |
| 3 | Rouwaida Kanj | [1] |
| 4 | Jente B. Kuang | [1] |
| 5 | Chandler McDowell | [1] |
| 6 | Sani R. Nassif | [1] |
| 7 | Jayakumaran Sivagnaname | [1] |