Elyse Rosenbaum

2006
19	EE	Hongmei Li, Cole E. Zemke, Giorgos Manetas, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris: An automated and efficient substrate noise analysis tool. IEEE Trans. on CAD of Integrated Circuits and Systems 25(3): 454-468 (2006)
2005
18	EE	Elyse Rosenbaum, Sami Hyvonen: On-chip ESD protection for RF I/Os: devices, circuits and models. ISCAS (2) 2005: 1202-1205
17	EE	Sami Hyvonen, Sopan Joshi, Elyse Rosenbaum: Comprehensive ESD protection for RF inputs. Microelectronics Reliability 45(2): 245-254 (2005)
2004
16	EE	Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum: Noise characterization of static CMOS gates. DAC 2004: 888-893
15	EE	Rouwaida Kanj, Elyse Rosenbaum: Critical evaluation of SOI design guidelines. IEEE Trans. VLSI Syst. 12(9): 885-894 (2004)
2003
14	EE	Sopan Joshi, Elyse Rosenbaum: Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation. Microelectronics Reliability 43(7): 1021-1027 (2003)
2002
13	EE	Hongmei Li, Jorge Carballido, Harry H. Yu, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris: Comprehensive frequency-dependent substrate noise analysis using boundary element methods. ICCAD 2002: 2-9
12	EE	Rouwaida Kanj, Elyse Rosenbaum: A critical look at design guidelines for SOI logic gates. ISCAS (3) 2002: 261-264
2001
11	EE	Jie Wu, Patrick Juliano, Elyse Rosenbaum: Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. Microelectronics Reliability 41(11): 1771-1779 (2001)
10	EE	Yu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum: Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits. Microelectronics Reliability 41(11): 1781-1787 (2001)
9	EE	Elyse Rosenbaum, Jie Wu: Trap generation and breakdown processes in very thin gate oxides. Microelectronics Reliability 41(5): 625-632 (2001)
2000
8	EE	Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang: Interconnect thermal modeling for accurate simulation of circuittiming and reliability. IEEE Trans. on CAD of Integrated Circuits and Systems 19(2): 197-205 (2000)
1999
7	EE	Tong Li, Ching-Han Tsai, Elyse Rosenbaum, Sung-Mo Kang: Substrate Modeling and Lumped Substrate Resistance Extraction for CMOS ESD/Latchup Circuit Simulation. DAC 1999: 549-554
6	EE	Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang: Interconnect thermal modeling for determining design limits on current density. ISPD 1999: 172-178
1998
5	EE	Yi-Kan Cheng, Prasun Raha, Chin-Chi Teng, Elyse Rosenbaum, Sung-Mo Kang: ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips. IEEE Trans. on CAD of Integrated Circuits and Systems 17(8): 668-681 (1998)
1997
4	EE	Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang: iTEM: a temperature-dependent electromigration reliability diagnosis tool. IEEE Trans. on CAD of Integrated Circuits and Systems 16(8): 882-893 (1997)
1996
3	EE	Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang: iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. DAC 1996: 548-551
2	EE	Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang: Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects. DAC 1996: 752-757
1993
1	EE	Robert H. Tu, Elyse Rosenbaum, Wilson Y. Chan, Chester C. Li, Eric Minami, Khandker Quader, Ping K. Ko, Chenming Hu: Berkeley reliability tools-BERT. IEEE Trans. on CAD of Integrated Circuits and Systems 12(10): 1524-1534 (1993)

Coauthor Index

1	Bhavna Agrawal	[16]
2	Andreas C. Cangellaris	[13] [19]
3	Jorge Carballido	[13]
4	Wilson Y. Chan	[1]
5	Danqing Chen	[6] [8]
6	Yi-Kan Cheng	[2] [3] [4] [5]
7	Abhijit Dharchoudhury	[3]
8	Chenming Hu	[1]
9	Sami Hyvonen	[17] [18]
10	Sopan Joshi	[10] [14] [17]
11	Patrick Juliano	[10] [11]
12	Sung-Mo Kang	[2] [3] [4] [5] [6] [7] [8]
13	Rouwaida Kanj	[12] [15] [16]
14	Ping K. Ko	[1]
15	Timothy Lehner	[16]
16	Chester C. Li	[1]
17	Erhong Li	[6] [8]
18	Hongmei Li	[13] [19]
19	Tong Li	[7]
20	Giorgos Manetas	[19]
21	Eric Minami	[1]
22	Vladimir I. Okhmatovski	[13] [19]
23	Khandker Quader	[1]
24	Prasun Raha	[5]
25	Chin-Chi Teng	[2] [3] [4] [5]
26	Ching-Han Tsai	[7]
27	Robert H. Tu	[1]
28	Yu Wang	[10]
29	Jie Wu	[9] [11]
30	Harry H. Yu	[13]
31	Cole E. Zemke	[19]

Colors in the list of coauthors