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Elyse Rosenbaum

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2006
19EEHongmei Li, Cole E. Zemke, Giorgos Manetas, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris: An automated and efficient substrate noise analysis tool. IEEE Trans. on CAD of Integrated Circuits and Systems 25(3): 454-468 (2006)
2005
18EEElyse Rosenbaum, Sami Hyvonen: On-chip ESD protection for RF I/Os: devices, circuits and models. ISCAS (2) 2005: 1202-1205
17EESami Hyvonen, Sopan Joshi, Elyse Rosenbaum: Comprehensive ESD protection for RF inputs. Microelectronics Reliability 45(2): 245-254 (2005)
2004
16EERouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum: Noise characterization of static CMOS gates. DAC 2004: 888-893
15EERouwaida Kanj, Elyse Rosenbaum: Critical evaluation of SOI design guidelines. IEEE Trans. VLSI Syst. 12(9): 885-894 (2004)
2003
14EESopan Joshi, Elyse Rosenbaum: Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation. Microelectronics Reliability 43(7): 1021-1027 (2003)
2002
13EEHongmei Li, Jorge Carballido, Harry H. Yu, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris: Comprehensive frequency-dependent substrate noise analysis using boundary element methods. ICCAD 2002: 2-9
12EERouwaida Kanj, Elyse Rosenbaum: A critical look at design guidelines for SOI logic gates. ISCAS (3) 2002: 261-264
2001
11EEJie Wu, Patrick Juliano, Elyse Rosenbaum: Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions. Microelectronics Reliability 41(11): 1771-1779 (2001)
10EEYu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum: Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits. Microelectronics Reliability 41(11): 1781-1787 (2001)
9EEElyse Rosenbaum, Jie Wu: Trap generation and breakdown processes in very thin gate oxides. Microelectronics Reliability 41(5): 625-632 (2001)
2000
8EEDanqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang: Interconnect thermal modeling for accurate simulation of circuittiming and reliability. IEEE Trans. on CAD of Integrated Circuits and Systems 19(2): 197-205 (2000)
1999
7EETong Li, Ching-Han Tsai, Elyse Rosenbaum, Sung-Mo Kang: Substrate Modeling and Lumped Substrate Resistance Extraction for CMOS ESD/Latchup Circuit Simulation. DAC 1999: 549-554
6EEDanqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang: Interconnect thermal modeling for determining design limits on current density. ISPD 1999: 172-178
1998
5EEYi-Kan Cheng, Prasun Raha, Chin-Chi Teng, Elyse Rosenbaum, Sung-Mo Kang: ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips. IEEE Trans. on CAD of Integrated Circuits and Systems 17(8): 668-681 (1998)
1997
4EEChin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang: iTEM: a temperature-dependent electromigration reliability diagnosis tool. IEEE Trans. on CAD of Integrated Circuits and Systems 16(8): 882-893 (1997)
1996
3EEYi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang: iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips. DAC 1996: 548-551
2EEChin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang: Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects. DAC 1996: 752-757
1993
1EERobert H. Tu, Elyse Rosenbaum, Wilson Y. Chan, Chester C. Li, Eric Minami, Khandker Quader, Ping K. Ko, Chenming Hu: Berkeley reliability tools-BERT. IEEE Trans. on CAD of Integrated Circuits and Systems 12(10): 1524-1534 (1993)

Coauthor Index

1Bhavna Agrawal [16]
2Andreas C. Cangellaris [13] [19]
3Jorge Carballido [13]
4Wilson Y. Chan [1]
5Danqing Chen [6] [8]
6Yi-Kan Cheng [2] [3] [4] [5]
7Abhijit Dharchoudhury [3]
8Chenming Hu [1]
9Sami Hyvonen [17] [18]
10Sopan Joshi [10] [14] [17]
11Patrick Juliano [10] [11]
12Sung-Mo Kang [2] [3] [4] [5] [6] [7] [8]
13Rouwaida Kanj [12] [15] [16]
14Ping K. Ko [1]
15Timothy Lehner [16]
16Chester C. Li [1]
17Erhong Li [6] [8]
18Hongmei Li [13] [19]
19Tong Li [7]
20Giorgos Manetas [19]
21Eric Minami [1]
22Vladimir I. Okhmatovski [13] [19]
23Khandker Quader [1]
24Prasun Raha [5]
25Chin-Chi Teng [2] [3] [4] [5]
26Ching-Han Tsai [7]
27Robert H. Tu [1]
28Yu Wang [10]
29Jie Wu [9] [11]
30Harry H. Yu [13]
31Cole E. Zemke [19]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)