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Kiran V. Chatty

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2006
3EED. Alvarez, M. J. Abou-Khalil, C. Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, J. Li, C. Seguin, R. Halbach: Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectronics Reliability 46(9-11): 1597-1602 (2006)
2003
2EEFranco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda: Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245
1EEFranco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson: Latchup Analysis Using Emission Microscopy. Microelectronics Reliability 43(9-11): 1603-1608 (2003)

Coauthor Index

1M. J. Abou-Khalil [3]
2D. Alvarez [3]
3Robert Gauthier [1] [2] [3]
4R. Halbach [3]
5D. Kontos [3]
6J. Li [3]
7Moyra K. McManus [1] [2]
8Mujahid Muhammad [1] [2]
9C. Russ [3]
10Pia Sanda [1] [2]
11C. Seguin [3]
12Peilin Song [1] [2]
13Franco Stellari [1] [2]
14Alan J. Weger [1] [2]
15Steve Wilson [1]
16Philip Wu [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)