Kiran V. Chatty

2006
3	EE	D. Alvarez, M. J. Abou-Khalil, C. Russ, Kiran V. Chatty, Robert Gauthier, D. Kontos, J. Li, C. Seguin, R. Halbach: Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. Microelectronics Reliability 46(9-11): 1597-1602 (2006)
2003
2	EE	Franco Stellari, Peilin Song, Moyra K. McManus, Robert Gauthier, Alan J. Weger, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda: Optical and Electrical Testing of Latchup in I/O Interface Circuits. ITC 2003: 236-245
1	EE	Franco Stellari, Peilin Song, Moyra K. McManus, Alan J. Weger, Robert Gauthier, Kiran V. Chatty, Mujahid Muhammad, Pia Sanda, Philip Wu, Steve Wilson: Latchup Analysis Using Emission Microscopy. Microelectronics Reliability 43(9-11): 1603-1608 (2003)

Coauthor Index

1	M. J. Abou-Khalil	[3]
2	D. Alvarez	[3]
3	Robert Gauthier	[1] [2] [3]
4	R. Halbach	[3]
5	D. Kontos	[3]
6	J. Li	[3]
7	Moyra K. McManus	[1] [2]
8	Mujahid Muhammad	[1] [2]
9	C. Russ	[3]
10	Pia Sanda	[1] [2]
11	C. Seguin	[3]
12	Peilin Song	[1] [2]
13	Franco Stellari	[1] [2]
14	Alan J. Weger	[1] [2]
15	Steve Wilson	[1]
16	Philip Wu	[1]