| 2006 |
|---|
| 3 | EE | D. Alvarez,
M. J. Abou-Khalil,
C. Russ,
Kiran V. Chatty,
Robert Gauthier,
D. Kontos,
J. Li,
C. Seguin,
R. Halbach:
Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant.
Microelectronics Reliability 46(9-11): 1597-1602 (2006) |
| 2003 |
|---|
| 2 | EE | Franco Stellari,
Peilin Song,
Moyra K. McManus,
Robert Gauthier,
Alan J. Weger,
Kiran V. Chatty,
Mujahid Muhammad,
Pia Sanda:
Optical and Electrical Testing of Latchup in I/O Interface Circuits.
ITC 2003: 236-245 |
| 1 | EE | Franco Stellari,
Peilin Song,
Moyra K. McManus,
Alan J. Weger,
Robert Gauthier,
Kiran V. Chatty,
Mujahid Muhammad,
Pia Sanda,
Philip Wu,
Steve Wilson:
Latchup Analysis Using Emission Microscopy.
Microelectronics Reliability 43(9-11): 1603-1608 (2003) |
