2005 | ||
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3 | EE | Stas Polonsky, M. Bhushan, A. Gattiker, Alan J. Weger, Peilin Song: Photon emission microscopy of inter/intra chip device performance variations. Microelectronics Reliability 45(9-11): 1471-1475 (2005) |
2004 | ||
2 | EE | Stas Polonsky, Keith A. Jenkins, Alan J. Weger, Shinho Cho: CMOS IC diagnostics using the luminescence of OFF-state leakage currents. ITC 2004: 134-139 |
1996 | ||
1 | EE | Stas Polonsky: RSFQ: What We Know and What We Don't. ICCD 1996: 406-412 |
1 | M. Bhushan | [3] |
2 | Shinho Cho | [2] |
3 | A. Gattiker | [3] |
4 | Keith A. Jenkins | [2] |
5 | Peilin Song | [3] |
6 | Alan J. Weger | [2] [3] |