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MTDT 2006: Taipei, Taiwan

14th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2006), 2-4 August 2006, Taipei, Taiwan. IEEE Computer Society 2006, ISBN 0-7695-2572-5 BibTeX

Introduction

Reception Talk

Keynote Speech 1

Keynote Speech 2

Invited Talk 1

Invited Talk 2

Invited Talk 3

Embedded Tutorial

Session T1: Memory Diagnosis & Repair

Session T2: Memory Device & Organization

Session V2: Memory Design and Testing (Invited)

Session T3: Flash & SRAM Characterization

Copyright © Sat May 16 23:30:57 2009 by Michael Ley (ley@uni-trier.de)