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2000 | ||
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3 | EE | Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf: Tutorial Statement. DATE 2000: 66 |
2 | EE | Kees Veelenturf: The Road to Better Reliability and Yield Embedded DfM Tools. DATE 2000: 67 |
1998 | ||
1 | EE | Ivo Schanstra, Dharmajaya Lukita, A. J. van de Goor, Kees Veelenturf, Paul J. van Wijnen: Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. ITC 1998: 872- |
1 | A. J. van de Goor | [1] |
2 | David Y. Lepejian | [3] |
3 | Dharmajaya Lukita | [1] |
4 | Peter Muhmenthaler | [3] |
5 | Michael Nicolaidis | [3] |
6 | Ivo Schanstra | [1] |
7 | Chris W. H. Strolenberg | [3] |
8 | Paul J. van Wijnen | [1] |
9 | Yervant Zorian | [3] |