Kees Veelenturf

2000
3	EE	Yervant Zorian, Michael Nicolaidis, Peter Muhmenthaler, David Y. Lepejian, Chris W. H. Strolenberg, Kees Veelenturf: Tutorial Statement. DATE 2000: 66
2	EE	Kees Veelenturf: The Road to Better Reliability and Yield Embedded DfM Tools. DATE 2000: 67
1998
1	EE	Ivo Schanstra, Dharmajaya Lukita, A. J. van de Goor, Kees Veelenturf, Paul J. van Wijnen: Semiconductor manufacturing process monitoring using built-in self-test for embedded memories. ITC 1998: 872-

Coauthor Index

1	A. J. van de Goor	[1]
2	David Y. Lepejian	[3]
3	Dharmajaya Lukita	[1]
4	Peter Muhmenthaler	[3]
5	Michael Nicolaidis	[3]
6	Ivo Schanstra	[1]
7	Chris W. H. Strolenberg	[3]
8	Paul J. van Wijnen	[1]
9	Yervant Zorian	[3]