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Rajesh Pendurkar

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2004
8EERajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian: Distributed Diagnosis of Interconnections in SoC and MCM Designs. J. Electronic Testing 20(3): 291-307 (2004)
2002
7EEIshwar Parulkar, Thomas A. Ziaja, Rajesh Pendurkar, Anand D'Souza, Amitava Majumdar: A Scalable, Low Cost Design-for-Test Architecture for UltraSPARC? Chip Multi-Processors. ITC 2002: 726-735
2001
6EERajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian: Switching activity generation with automated BIST synthesis forperformance testing of interconnects. IEEE Trans. on CAD of Integrated Circuits and Systems 20(9): 1143-1158 (2001)
2000
5EEMarly Roncken, Ken S. Stevens, Rajesh Pendurkar, Shai Rotem, Parimal Pal Chaudhuri: CA-BIST for Asynchronous Circuits: A Case Study on the RAPPID Asynchronous Instruction Length Decoder. ASYNC 2000: 62-72
1999
4EERajesh Pendurkar, Craig A. Tovey, Abhijit Chatterjee: Single-probe traversal optimization for testing of MCM substrate interconnections. IEEE Trans. on CAD of Integrated Circuits and Systems 18(8): 1178-1191 (1999)
1998
3EERajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian: Synthesis of BIST hardware for performance testing of MCM interconnections. ICCAD 1998: 69-73
2EERajesh Pendurkar, Abhijit Chatterjee, Yervant Zorian: A distributed BIST technique for diagnosis of MCM interconnections. ITC 1998: 214-221
1996
1EERajesh Pendurkar, Abhijit Chatterjee, Craig A. Tovey: Optimal single probe traversal algorithm for testing of MCM substrat. ICCD 1996: 396-

Coauthor Index

1Abhijit Chatterjee [1] [2] [3] [4] [6] [8]
2Parimal Pal Chaudhuri [5]
3Anand D'Souza [7]
4Amitava Majumdar [7]
5Ishwar Parulkar [7]
6Marly Roncken [5]
7Shai Rotem [5]
8Ken S. Stevens [5]
9Craig A. Tovey [1] [4]
10Thomas A. Ziaja [7]
11Yervant Zorian [2] [3] [6] [8]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)