| 2004 |
|---|
| 8 | EE | Rajesh Pendurkar,
Abhijit Chatterjee,
Yervant Zorian:
Distributed Diagnosis of Interconnections in SoC and MCM Designs.
J. Electronic Testing 20(3): 291-307 (2004) |
| 2002 |
|---|
| 7 | EE | Ishwar Parulkar,
Thomas A. Ziaja,
Rajesh Pendurkar,
Anand D'Souza,
Amitava Majumdar:
A Scalable, Low Cost Design-for-Test Architecture for UltraSPARC? Chip Multi-Processors.
ITC 2002: 726-735 |
| 2001 |
|---|
| 6 | EE | Rajesh Pendurkar,
Abhijit Chatterjee,
Yervant Zorian:
Switching activity generation with automated BIST synthesis forperformance testing of interconnects.
IEEE Trans. on CAD of Integrated Circuits and Systems 20(9): 1143-1158 (2001) |
| 2000 |
|---|
| 5 | EE | Marly Roncken,
Ken S. Stevens,
Rajesh Pendurkar,
Shai Rotem,
Parimal Pal Chaudhuri:
CA-BIST for Asynchronous Circuits: A Case Study on the RAPPID Asynchronous Instruction Length Decoder.
ASYNC 2000: 62-72 |
| 1999 |
|---|
| 4 | EE | Rajesh Pendurkar,
Craig A. Tovey,
Abhijit Chatterjee:
Single-probe traversal optimization for testing of MCM substrate interconnections.
IEEE Trans. on CAD of Integrated Circuits and Systems 18(8): 1178-1191 (1999) |
| 1998 |
|---|
| 3 | EE | Rajesh Pendurkar,
Abhijit Chatterjee,
Yervant Zorian:
Synthesis of BIST hardware for performance testing of MCM interconnections.
ICCAD 1998: 69-73 |
| 2 | EE | Rajesh Pendurkar,
Abhijit Chatterjee,
Yervant Zorian:
A distributed BIST technique for diagnosis of MCM interconnections.
ITC 1998: 214-221 |
| 1996 |
|---|
| 1 | EE | Rajesh Pendurkar,
Abhijit Chatterjee,
Craig A. Tovey:
Optimal single probe traversal algorithm for testing of MCM substrat.
ICCD 1996: 396- |
