2008 | ||
---|---|---|
2 | EE | Chin-Lung Su, Chih-Wea Tsai, Cheng-Wen Wu, Chien-Chung Hung, Young-Shying Chen, Ding-Yeong Wang, Yuan-Jen Lee, Ming-Jer Kao: Write Disturbance Modeling and Testing for MRAM. IEEE Trans. VLSI Syst. 16(3): 277-288 (2008) |
2004 | ||
1 | EE | Chin-Lung Su, Rei-Fu Huang, Cheng-Wen Wu, Chien-Chung Hung, Ming-Jer Kao, Yeong-Jar Chang, Wen Ching Wu: MRAM Defect Analysis and Fault Modeli. ITC 2004: 124-133 |
1 | Yeong-Jar Chang | [1] |
2 | Young-Shying Chen | [2] |
3 | Rei-Fu Huang | [1] |
4 | Chien-Chung Hung | [1] [2] |
5 | Yuan-Jen Lee | [2] |
6 | Chin-Lung Su | [1] [2] |
7 | Chih-Wea Tsai | [2] |
8 | Ding-Yeong Wang | [2] |
9 | Cheng-Wen Wu | [1] [2] |
10 | Wen Ching Wu | [1] |