| |
| 2007 | ||
|---|---|---|
| 3 | EE | Rei-Fu Huang, Chao-Hsun Chen, Cheng-Wen Wu: Economic Aspects of Memory Built-in Self-Repair. IEEE Design & Test of Computers 24(2): 164-172 (2007) |
| 2006 | ||
| 2 | EE | Yu-Ying Hsiao, Chao-Hsun Chen, Cheng-Wen Wu: A Built-In Self-Repair Scheme for NOR-Type Flash Memory. VTS 2006: 114-119 |
| 2005 | ||
| 1 | EE | Yu-Chun Dawn, Jen-Chieh Yeh, Cheng-Wen Wu, Chia-Ching Wang, Yung-Chen Lin, Chao-Hsun Chen: Flash Memory Die Sort by a Sample Classification Method. Asian Test Symposium 2005: 182-187 |
| 1 | Yu-Chun Dawn | [1] |
| 2 | Yu-Ying Hsiao | [2] |
| 3 | Rei-Fu Huang | [3] |
| 4 | Yung-Chen Lin | [1] |
| 5 | Chia-Ching Wang | [1] |
| 6 | Cheng-Wen Wu | [1] [2] [3] |
| 7 | Jen-Chieh Yeh | [1] |