2007 | ||
---|---|---|
3 | EE | Rei-Fu Huang, Chao-Hsun Chen, Cheng-Wen Wu: Economic Aspects of Memory Built-in Self-Repair. IEEE Design & Test of Computers 24(2): 164-172 (2007) |
2006 | ||
2 | EE | Yu-Ying Hsiao, Chao-Hsun Chen, Cheng-Wen Wu: A Built-In Self-Repair Scheme for NOR-Type Flash Memory. VTS 2006: 114-119 |
2005 | ||
1 | EE | Yu-Chun Dawn, Jen-Chieh Yeh, Cheng-Wen Wu, Chia-Ching Wang, Yung-Chen Lin, Chao-Hsun Chen: Flash Memory Die Sort by a Sample Classification Method. Asian Test Symposium 2005: 182-187 |
1 | Yu-Chun Dawn | [1] |
2 | Yu-Ying Hsiao | [2] |
3 | Rei-Fu Huang | [3] |
4 | Yung-Chen Lin | [1] |
5 | Chia-Ching Wang | [1] |
6 | Cheng-Wen Wu | [1] [2] [3] |
7 | Jen-Chieh Yeh | [1] |