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2007 | ||
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4 | EE | Selim Sermet Akbay, Abhijit Chatterjee: Fault-based alternate test of RF components. ICCD 2007: 518-525 |
2005 | ||
3 | EE | Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt: On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS 2005: 106-111 |
2 | EE | Selim Sermet Akbay, Abhijit Chatterjee: Built-In Test of RF Components Using Mapped Feature Extraction Sensors. VTS 2005: 243-248 |
2004 | ||
1 | EE | Selim Sermet Akbay, Abhijit Chatterjee: Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference. VTS 2004: 273-290 |
1 | Soumendu Bhattacharya | [3] |
2 | Abhijit Chatterjee | [1] [2] [3] [4] |
3 | William R. Eisenstadt | [3] |
4 | Donghoon Han | [3] |