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Selim Sermet Akbay

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2007
4EESelim Sermet Akbay, Abhijit Chatterjee: Fault-based alternate test of RF components. ICCD 2007: 518-525
2005
3EEDonghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt: On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST). IOLTS 2005: 106-111
2EESelim Sermet Akbay, Abhijit Chatterjee: Built-In Test of RF Components Using Mapped Feature Extraction Sensors. VTS 2005: 243-248
2004
1EESelim Sermet Akbay, Abhijit Chatterjee: Feature Extraction Based Built-In Alternate Test of RF Components Using a Noise Reference. VTS 2004: 273-290

Coauthor Index

1Soumendu Bhattacharya [3]
2Abhijit Chatterjee [1] [2] [3] [4]
3William R. Eisenstadt [3]
4Donghoon Han [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)