2007 |
3 | EE | Vikram Iyengar,
Kenneth Pichamuthu,
Andrew Ferko,
Frank Woytowich,
David E. Lackey,
Gary Grise,
Mark Taylor,
Mike Degregorio,
Steven F. Oakland:
An Integrated Framework for At-Speed and ATE-Driven Delay Test of Contract-Manufactured ASICs.
VTS 2007: 173-178 |
2004 |
2 | EE | Pamela S. Gillis,
Francis Woytowich,
Andrew Ferko,
Kevin McCauley:
Low Overhead Delay Testing of ASICS.
ITC 2004: 534-542 |
2002 |
1 | EE | Carl Barnhart,
Vanessa Brunkhorst,
Frank Distler,
Owen Farnsworth,
Andrew Ferko,
Brion L. Keller,
David Scott,
Bernd Könemann,
Takeshi Onodera:
Extending OPMISR beyond 10x Scan Test Efficiency.
IEEE Design & Test of Computers 19(5): 65-72 (2002) |