| 2008 |
| 13 | EE | Paolo Bernardi,
Kyriakos Christou,
Michelangelo Grosso,
Maria K. Michael,
Ernesto Sánchez,
Matteo Sonza Reorda:
Exploiting MOEA to Automatically Geneate Test Programs for Path-Delay Faults in Microprocessors.
EvoWorkshops 2008: 224-234 |
| 12 | EE | Kyriakos Christou,
Maria K. Michael,
Paolo Bernardi,
Michelangelo Grosso,
Ernesto Sánchez,
Matteo Sonza Reorda:
A Novel SBST Generation Technique for Path-Delay Faults in Microprocessors Exploiting Gate- and RT-Level Descriptions.
VTS 2008: 389-394 |
| 2007 |
| 11 | EE | Paolo Bernardi,
Michelangelo Grosso,
Matteo Sonza Reorda:
Hardware-accelerated path-delay fault grading of functional test programs for processor-based systems.
ACM Great Lakes Symposium on VLSI 2007: 411-416 |
| 10 | EE | Jorge Luis Lagos-Benites,
Davide Appello,
Paolo Bernardi,
Michelangelo Grosso,
Danilo Ravotto,
Edgar E. Sánchez,
Matteo Sonza Reorda:
An Effective Approach for the Diagnosis of Transition-Delay Faults in SoCs, based on SBST and Scan Chains.
DFT 2007: 291-300 |
| 9 | EE | Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
Safety Evaluation of NanoFabrics.
DFT 2007: 418-426 |
| 8 | EE | Paolo Bernardi,
Michelangelo Grosso,
Ernesto Sánchez,
Matteo Sonza Reorda:
On the Automatic Generation of Test Programs for Path-Delay Faults in Microprocessor Cores.
European Test Symposium 2007: 179-184 |
| 7 | EE | Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A System-layer Infrastructure for SoC Diagnosis.
J. Electronic Testing 23(5): 389-404 (2007) |
| 2006 |
| 6 | | Paolo Bernardi,
Michelangelo Grosso:
Test Considerations about the Structured ASIC Paradigm.
DDECS 2006: 232-233 |
| 5 | EE | Davide Appello,
Vincenzo Tancorre,
Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
On the Automation of the Test Flow of Complex SoCs.
VTS 2006: 166-171 |
| 4 | EE | Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
A Pattern Ordering Algorithm for Reducing the Size of Fault Dictionaries.
VTS 2006: 386-391 |
| 3 | EE | Davide Appello,
Paolo Bernardi,
Michelangelo Grosso,
Matteo Sonza Reorda:
System-in-Package Testing: Problems and Solutions.
IEEE Design & Test of Computers 23(3): 203-211 (2006) |
| 2005 |
| 2 | EE | Alberto Manzone,
Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Ernesto Sánchez,
Matteo Sonza Reorda:
Integrating BIST Techniques for On-Line SoC Testing.
IOLTS 2005: 235-240 |
| 1 | EE | Paolo Bernardi,
Michelangelo Grosso,
Maurizio Rebaudengo,
Matteo Sonza Reorda:
Exploiting an I-IP for both Test and Silicon Debug of Microprocessor Cores.
MTV 2005: 55-62 |