| 2008 |
|---|
| 6 | EE | Stephen K. Sunter,
Aubin Roy:
Noise-Insensitive Digital BIST for any PLL or DLL.
J. Electronic Testing 24(5): 461-472 (2008) |
| 2007 |
|---|
| 5 | EE | Stephen K. Sunter,
Aubin Roy:
Purely Digital BIST for Any PLL or DLL.
European Test Symposium 2007: 185-192 |
| 2004 |
|---|
| 4 | EE | Stephen K. Sunter,
Aubin Roy,
Jean-Francois Cote:
An Automated, Complete, Structural Test Solution for SERDES.
ITC 2004: 95-104 |
| 3 | EE | Stephen K. Sunter,
Aubin Roy:
On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz.
IEEE Design & Test of Computers 21(4): 314-321 (2004) |
| 2002 |
|---|
| 2 | EE | Aubin Roy,
Stephen K. Sunter,
Alessandra Fudoli,
Davide Appello:
High Accuracy Stimulus Generation for A/D Converter BIST.
ITC 2002: 1031-1039 |
| 1999 |
|---|
| 1 | | Stephen K. Sunter,
Aubin Roy:
BIST for phase-locked loops in digital applications.
ITC 1999: 532-540 |
