| 2009 |
|---|
| 7 | EE | Man-Lap Li,
Pradeep Ramachandran,
Ulya R. Karpuzcu,
Siva Kumar Sastry Hari,
Sarita V. Adve:
Accurate microarchitecture-level fault modeling for studying hardware faults.
HPCA 2009: 105-116 |
| 2008 |
|---|
| 6 | EE | Man-Lap Li,
Pradeep Ramachandran,
Swarup Kumar Sahoo,
Sarita V. Adve,
Vikram S. Adve,
Yuanyuan Zhou:
Understanding the propagation of hard errors to software and implications for resilient system design.
ASPLOS 2008: 265-276 |
| 5 | EE | Pradeep Ramachandran,
Prabhakar Kudva,
Jeffrey W. Kellington,
John Schumann,
Pia Sanda:
Statistical Fault Injection.
DSN 2008: 122-127 |
| 4 | EE | Man-Lap Li,
Pradeep Ramachandran,
Swarup Kumar Sahoo,
Sarita V. Adve,
Vikram S. Adve,
Yuanyuan Zhou:
Trace-based microarchitecture-level diagnosis of permanent hardware faults.
DSN 2008: 22-31 |
| 3 | EE | Swarup Kumar Sahoo,
Man-Lap Li,
Pradeep Ramachandran,
Sarita V. Adve,
Vikram S. Adve,
Yuanyuan Zhou:
Using likely program invariants to detect hardware errors.
DSN 2008: 70-79 |
| 2 | EE | Pradeep Ramachandran,
Sarita V. Adve,
Pradip Bose,
Jude A. Rivers:
Metrics for Architecture-Level Lifetime Reliability Analysis.
ISPASS 2008: 202-212 |
| 2004 |
|---|
| 1 | EE | Ashish Batra,
Pradeep Ramachandran,
Poornima Sathyanarayanan,
Susan Lu,
Hari Srihari:
Reliability enhancement of electronic packages by design of optimal parameters.
Microelectronics Reliability 44(7): 1157-1163 (2004) |
