P. De Wit

2008
1	EE	Georges G. E. Gielen, P. De Wit, E. Maricau, J. Loeckx, J. Martin-Martinez, Ben Kaczer, Guido Groeseneken, R. Rodríguez, M. Nafría: Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. DATE 2008: 1322-1327

Coauthor Index

1	Georges G. E. Gielen	[1]
2	Guido Groeseneken	[1]
3	Ben Kaczer	[1]
4	J. Loeckx	[1]
5	E. Maricau	[1]
6	J. Martin-Martinez	[1]
7	M. Nafría	[1]
8	R. Rodríguez	[1]