| |
| 2008 | ||
|---|---|---|
| 1 | EE | Georges G. E. Gielen, P. De Wit, E. Maricau, J. Loeckx, J. Martin-Martinez, Ben Kaczer, Guido Groeseneken, R. Rodríguez, M. Nafría: Emerging Yield and Reliability Challenges in Nanometer CMOS Technologies. DATE 2008: 1322-1327 |
| 1 | Georges G. E. Gielen | [1] |
| 2 | Guido Groeseneken | [1] |
| 3 | Ben Kaczer | [1] |
| 4 | E. Maricau | [1] |
| 5 | J. Martin-Martinez | [1] |
| 6 | M. Nafría | [1] |
| 7 | R. Rodríguez | [1] |
| 8 | P. De Wit | [1] |