| 2004 |
|---|
| 7 | EE | Mohamed Hafed:
Glamorous Analog Testability - We Already Test them and Ship Them - So What is the Problem?
ITC 2004: 1416 |
| 6 | EE | Mohamed Hafed,
Antonio H. Chan,
Geoffrey Duerden,
Bardia Pishdad,
Clarence Tam,
Sebastien Laberge,
Gordon W. Roberts:
A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing.
ITC 2004: 728-737 |
| 2002 |
|---|
| 5 | EE | Mohamed Hafed,
Gordon W. Roberts:
Test and Evaluation of Multiple Embedded Mixed-Signal Test Cores.
ITC 2002: 1022-1030 |
| 2001 |
|---|
| 4 | EE | Nazmy Abaskharoun,
Mohamed Hafed,
Gordon W. Roberts:
Strategies for on-chip sub-nanosecond signal capture and timing measurements.
ISCAS (4) 2001: 174-177 |
| 3 | | Mohamed Hafed,
Nazmy Abaskharoun,
Gordon W. Roberts:
A stand-alone integrated test core for time and frequency domain measurements.
ITC 2001: 1190-1199 |
| 2 | EE | Mohamed Hafed,
Mourad Oulmane,
Nicholas C. Rumin:
Delay and current estimation in a CMOS inverter with an RC load.
IEEE Trans. on CAD of Integrated Circuits and Systems 20(1): 80-89 (2001) |
| 2000 |
|---|
| 1 | | Mohamed Hafed,
Nazmy Abaskharoun,
Gordon W. Roberts:
A stand-alone integrated test core for time and frequency domain measurements.
ITC 2000: 1031-1040 |
