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Antonio H. Chan

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2004
3EEMohamed Hafed, Antonio H. Chan, Geoffrey Duerden, Bardia Pishdad, Clarence Tam, Sebastien Laberge, Gordon W. Roberts: A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing. ITC 2004: 728-737
2 Antonio H. Chan, Gordon W. Roberts: A jitter characterization system using a component-invariant Vernier delay line. IEEE Trans. VLSI Syst. 12(1): 79-95 (2004)
2001
1 Antonio H. Chan, Gordon W. Roberts: A synthesizable, fast and high-resolution timing measurement device using a component-invariant vernier delay line. ITC 2001: 858-867

Coauthor Index

1Geoffrey Duerden [3]
2Mohamed Hafed [3]
3Sebastien Laberge [3]
4Bardia Pishdad [3]
5Gordon W. Roberts [1] [2] [3]
6Clarence Tam [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)