Antonio H. Chan

2004
3	EE	Mohamed Hafed, Antonio H. Chan, Geoffrey Duerden, Bardia Pishdad, Clarence Tam, Sebastien Laberge, Gordon W. Roberts: A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing. ITC 2004: 728-737
2		Antonio H. Chan, Gordon W. Roberts: A jitter characterization system using a component-invariant Vernier delay line. IEEE Trans. VLSI Syst. 12(1): 79-95 (2004)
2001
1		Antonio H. Chan, Gordon W. Roberts: A synthesizable, fast and high-resolution timing measurement device using a component-invariant vernier delay line. ITC 2001: 858-867

Coauthor Index

1	Geoffrey Duerden	[3]
2	Mohamed Hafed	[3]
3	Sebastien Laberge	[3]
4	Bardia Pishdad	[3]
5	Gordon W. Roberts	[1] [2] [3]
6	Clarence Tam	[3]