| 2005 |
|---|
| 6 | EE | S. Huyghe,
L. Béchou,
N. Zerounian,
Y. Deshayes,
F. Aniel,
A. Denolle,
D. Laffitte,
J. L. Goudard,
Y. Danto:
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier.
Microelectronics Reliability 45(9-11): 1593-1599 (2005) |
| 2003 |
|---|
| 5 | EE | Y. Deshayes,
L. Béchou,
J.-Y. Delétage,
F. Verdier,
Y. Danto,
D. Laffitte,
J. L. Goudard:
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.
Microelectronics Reliability 43(7): 1125-1136 (2003) |
| 4 | EE | J.-Y. Delétage,
F. J.-M. Verdier,
B. Plano,
Y. Deshayes,
L. Béchou,
Y. Danto:
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.
Microelectronics Reliability 43(7): 1137-1144 (2003) |
| 3 | EE | L. Mendizabal,
Jean-Louis Verneuil,
L. Béchou,
Christelle Aupetit-Berthelemot,
Y. Deshayes,
F. Verdier,
Jean-Michel Dumas,
Y. Danto,
D. Laffitte,
J. L. Goudard:
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator.
Microelectronics Reliability 43(9-11): 1743-1749 (2003) |
| 2002 |
|---|
| 2 | EE | B. Trégon,
Y. Ousten,
Y. Danto,
L. Béchou,
B. Parmentier:
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions.
Microelectronics Reliability 42(7): 1113-1120 (2002) |
| 1 | EE | J. Augereau,
Y. Ousten,
L. Béchou,
Y. Danto:
Acoustic analysis of an assembly: Structural identification by signal processing (wavelets).
Microelectronics Reliability 42(9-11): 1517-1522 (2002) |
