H. A. Post

2005
1	EE	H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Y. Ousten, G. Lekens, A. Dehbi: Failure mechanisms and qualification testing of passive components. Microelectronics Reliability 45(9-11): 1626-1632 (2005)

Coauthor Index

1	T. Briolat	[1]
2	A. Dehbi	[1]
3	R. Humke	[1]
4	G. Lekens	[1]
5	P. Letullier	[1]
6	Y. Ousten	[1]
7	K. Saarinen	[1]
8	R. Schuhmann	[1]
9	W. Werner	[1]