| |
| 2002 | ||
|---|---|---|
| 1 | EE | B. Trégon, Y. Ousten, Y. Danto, L. Béchou, B. Parmentier: Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. Microelectronics Reliability 42(7): 1113-1120 (2002) |
| 1 | L. Béchou | [1] |
| 2 | Y. Danto | [1] |
| 3 | Y. Ousten | [1] |
| 4 | B. Parmentier | [1] |