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2002 | ||
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1 | EE | B. Trégon, Y. Ousten, Y. Danto, L. Béchou, B. Parmentier: Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions. Microelectronics Reliability 42(7): 1113-1120 (2002) |
1 | L. Béchou | [1] |
2 | Y. Danto | [1] |
3 | Y. Ousten | [1] |
4 | B. Parmentier | [1] |