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P. Letullier

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2005
1EEH. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Y. Ousten, G. Lekens, A. Dehbi: Failure mechanisms and qualification testing of passive components. Microelectronics Reliability 45(9-11): 1626-1632 (2005)

Coauthor Index

1T. Briolat [1]
2A. Dehbi [1]
3R. Humke [1]
4G. Lekens [1]
5Y. Ousten [1]
6H. A. Post [1]
7K. Saarinen [1]
8R. Schuhmann [1]
9W. Werner [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)