| 2005 |
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P. Letullier,
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Failure mechanisms and qualification testing of passive components.
Microelectronics Reliability 45(9-11): 1626-1632 (2005) |
| 1997 |
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W. Werner:
Tied Favourite Edges for Simple Random Walk.
Combinatorics, Probability & Computing 6(3): 359-369 (1997) |
| 1964 |
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| 1 | EE | R. F. Dressler,
W. Werner:
Error Rates for Two Methods of Statistical Pattern Recognition.
J. ACM 11(4): 471-480 (1964) |
