| |
| 2005 | ||
|---|---|---|
| 1 | EE | H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Y. Ousten, G. Lekens, A. Dehbi: Failure mechanisms and qualification testing of passive components. Microelectronics Reliability 45(9-11): 1626-1632 (2005) |
| 1 | T. Briolat | [1] |
| 2 | A. Dehbi | [1] |
| 3 | R. Humke | [1] |
| 4 | G. Lekens | [1] |
| 5 | P. Letullier | [1] |
| 6 | Y. Ousten | [1] |
| 7 | H. A. Post | [1] |
| 8 | R. Schuhmann | [1] |
| 9 | W. Werner | [1] |