G. Lekens

2005
2	EE	H. A. Post, P. Letullier, T. Briolat, R. Humke, R. Schuhmann, K. Saarinen, W. Werner, Y. Ousten, G. Lekens, A. Dehbi: Failure mechanisms and qualification testing of passive components. Microelectronics Reliability 45(9-11): 1626-1632 (2005)
2003
1	EE	P. Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, E. Beyne: Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. Microelectronics Reliability 43(9-11): 1785-1790 (2003)

Coauthor Index

1	E. Beyne	[1]
2	T. Briolat	[2]
3	Ward De Ceuninck	[1]
4	A. Dehbi	[2]
5	R. Dreesen	[1]
6	R. Humke	[2]
7	P. Letullier	[2]
8	Y. Ousten	[2]
9	H. A. Post	[2]
10	K. Saarinen	[2]
11	R. Schuhmann	[2]
12	P. Soussan	[1]
13	W. Werner	[2]

Colors in the list of coauthors