| 1999 |
|---|
| 4 | EE | Heebyung Yoon,
Junwei Hou,
Swapan K. Bhattacharya,
Abhijit Chatterjee,
Madhavan Swaminathan:
Fault Detection and Automated Fault Diagnosis for Embedded Integrated Electrical Passives.
VLSI Signal Processing 21(3): 265-276 (1999) |
| 1998 |
|---|
| 3 | EE | Heebyung Yoon,
Pramodchandran N. Variyam,
Abhijit Chatterjee,
Naveena Nagi:
Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits.
VTS 1998: 145-151 |
| 2 | EE | Naveena Nagi,
Abhijit Chatterjee,
Heebyung Yoon,
Jacob A. Abraham:
Signature analysis for analog and mixed-signal circuit test response compaction.
IEEE Trans. on CAD of Integrated Circuits and Systems 17(6): 540-546 (1998) |
| 1997 |
|---|
| 1 | EE | Heebyung Yoon,
Abhijit Chatterjee,
Joseph L. A. Hughes:
Optimal Design of Checksum-Based Checkers for Fault Detection in Linear Analog Circuits.
VLSI Design 1997: 393-397 |
