Fred G. Kuper

2006
11	EE	Cora Salm, A. J. Hof, Fred G. Kuper, J. Schmitz: Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs. Microelectronics Reliability 46(9-11): 1617-1622 (2006)
2005
10	EE	M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper: A 3-D Circuit Model to evaluate CDM performance of ICs. Microelectronics Reliability 45(9-11): 1425-1429 (2005)
2004
9	EE	Guoqiao Tao, Andrea Scarpa, Leo van Marwijk, Kitty van Dijk, Fred G. Kuper: Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes. Microelectronics Reliability 44(8): 1269-1273 (2004)
2003
8	EE	Yuan Li, Klaas Jelle Veenstra, Jerôme Dubois, Lei Peters-Wu, Agnes van Zomeren, Fred G. Kuper: Reservoir effect and maximum allowed VIA misalignment for AlCu interconnect with tungsten VIA plug. Microelectronics Reliability 43(9-11): 1449-1454 (2003)
7	EE	M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper: Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. Microelectronics Reliability 43(9-11): 1569-1575 (2003)
2002
6	EE	N. Tosic Golo, Fred G. Kuper, Ton J. Mouthaan: Zapping thin film transistors. Microelectronics Reliability 42(4-5): 747-765 (2002)
5	EE	M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper: The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. Microelectronics Reliability 42(9-11): 1287-1292 (2002)
4	EE	H. V. Nguyen, Cora Salm, J. Vroemen, J. Voets, B. Krabbenborg, J. Bisschop, A. J. Mouthaan, Fred G. Kuper: Fast temperature cycling and electromigration induced thin film cracking in multilevel interconnection: experiments and modeling. Microelectronics Reliability 42(9-11): 1415-1420 (2002)
3	EE	H. V. Nguyen, Cora Salm, R. Wenzel, A. J. Mouthaan, Fred G. Kuper: Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime. Microelectronics Reliability 42(9-11): 1421-1425 (2002)
2001
2	EE	Gianluca Boselli, Stan Meeuwsen, Ton J. Mouthaan, Fred G. Kuper: Investigations on double-diffused MOS transistors under ESD zap conditions. Microelectronics Reliability 41(3): 395-405 (2001)
1		N. Tosic Golo, S. van der Wal, Fred G. Kuper, Ton J. Mouthaan: The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin-film transistors. Microelectronics Reliability 41(9-10): 1391-1396 (2001)

Coauthor Index

1	J. Bisschop	[4]
2	Gianluca Boselli	[2]
3	Kitty van Dijk	[9]
4	Jerôme Dubois	[8]
5	N. Tosic Golo	[1] [6]
6	A. J. Hof	[11]
7	Peter C. de Jong	[10]
8	B. Krabbenborg	[4]
9	Yuan Li	[8]
10	Leo van Marwijk	[9]
11	Stan Meeuwsen	[2]
12	A. J. Mouthaan	[3] [4]
13	Ton J. Mouthaan	[1] [2] [5] [6] [7] [10]
14	H. V. Nguyen	[3] [4]
15	Lei Peters-Wu	[8]
16	Cora Salm	[3] [4] [5] [7] [10] [11]
17	Andrea Scarpa	[9]
18	J. Schmitz	[11]
19	Theo Smedes	[5] [7] [10]
20	M. S. B. Sowariraj	[5] [7] [10]
21	Guoqiao Tao	[9]
22	Klaas Jelle Veenstra	[8]
23	J. Voets	[4]
24	J. Vroemen	[4]
25	S. van der Wal	[1]
26	R. Wenzel	[3]
27	Agnes van Zomeren	[8]

Colors in the list of coauthors