| 2006 |
|---|
| 3 | EE | Charvaka Duvvury,
Robert Steinhoff,
Gianluca Boselli,
Vijay Reddy,
Hans Kunz,
Steve Marum,
Roger Cline:
Gate oxide failures due to anomalous stress from HBM ESD testers.
Microelectronics Reliability 46(5-6): 656-665 (2006) |
| 2005 |
|---|
| 2 | EE | Jeremy C. Smith,
Gianluca Boselli:
A MOSFET power supply clamp with feedback enhanced triggering for ESD protection in advanced CMOS technologies.
Microelectronics Reliability 45(2): 201-210 (2005) |
| 2001 |
|---|
| 1 | EE | Gianluca Boselli,
Stan Meeuwsen,
Ton J. Mouthaan,
Fred G. Kuper:
Investigations on double-diffused MOS transistors under ESD zap conditions.
Microelectronics Reliability 41(3): 395-405 (2001) |
