| |
| 2001 | ||
|---|---|---|
| 1 | EE | Gianluca Boselli, Stan Meeuwsen, Ton J. Mouthaan, Fred G. Kuper: Investigations on double-diffused MOS transistors under ESD zap conditions. Microelectronics Reliability 41(3): 395-405 (2001) |
| 1 | Gianluca Boselli | [1] |
| 2 | Fred G. Kuper | [1] |
| 3 | Ton J. Mouthaan | [1] |