| |
| 2002 | ||
|---|---|---|
| 2 | EE | N. Tosic Golo, Fred G. Kuper, Ton J. Mouthaan: Zapping thin film transistors. Microelectronics Reliability 42(4-5): 747-765 (2002) |
| 2001 | ||
| 1 | N. Tosic Golo, S. van der Wal, Fred G. Kuper, Ton J. Mouthaan: The time-voltage trade-off for ESD damage threshold in amorphous silicon hydrogenated thin-film transistors. Microelectronics Reliability 41(9-10): 1391-1396 (2001) | |
| 1 | Fred G. Kuper | [1] [2] |
| 2 | Ton J. Mouthaan | [1] [2] |
| 3 | S. van der Wal | [1] |