dblp.uni-trier.dewww.uni-trier.de

M. S. B. Sowariraj

List of publications from the DBLP Bibliography Server - FAQ
Coauthor Index - Ask others: ACM DL/Guide - CiteSeer - CSB - Google - MSN - Yahoo

2005
3EEM. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper: A 3-D Circuit Model to evaluate CDM performance of ICs. Microelectronics Reliability 45(9-11): 1425-1429 (2005)
2003
2EEM. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper: Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy. Microelectronics Reliability 43(9-11): 1569-1575 (2003)
2002
1EEM. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper: The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. Microelectronics Reliability 42(9-11): 1287-1292 (2002)

Coauthor Index

1Peter C. de Jong [3]
2Fred G. Kuper [1] [2] [3]
3Ton J. Mouthaan [1] [2] [3]
4Cora Salm [1] [2] [3]
5Theo Smedes [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)