2005 |
3 | EE | M. S. B. Sowariraj,
Theo Smedes,
Peter C. de Jong,
Cora Salm,
Ton J. Mouthaan,
Fred G. Kuper:
A 3-D Circuit Model to evaluate CDM performance of ICs.
Microelectronics Reliability 45(9-11): 1425-1429 (2005) |
2003 |
2 | EE | M. S. B. Sowariraj,
Theo Smedes,
Cora Salm,
Ton J. Mouthaan,
Fred G. Kuper:
Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategy.
Microelectronics Reliability 43(9-11): 1569-1575 (2003) |
2002 |
1 | EE | M. S. B. Sowariraj,
Theo Smedes,
Cora Salm,
Ton J. Mouthaan,
Fred G. Kuper:
The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress.
Microelectronics Reliability 42(9-11): 1287-1292 (2002) |