| |
| 2004 | ||
|---|---|---|
| 1 | EE | Guoqiao Tao, Andrea Scarpa, Leo van Marwijk, Kitty van Dijk, Fred G. Kuper: Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes. Microelectronics Reliability 44(8): 1269-1273 (2004) |
| 1 | Fred G. Kuper | [1] |
| 2 | Leo van Marwijk | [1] |
| 3 | Andrea Scarpa | [1] |
| 4 | Guoqiao Tao | [1] |