A. J. Hof
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2006
1
EE
Cora Salm
, A. J. Hof,
Fred G. Kuper
,
J. Schmitz
: Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs.
Microelectronics Reliability 46
(9-11): 1617-1622 (2006)
Coauthor
Index
1
Fred G. Kuper
[
1
]
2
Cora Salm
[
1
]
3
J. Schmitz
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
