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| 2005 | ||
|---|---|---|
| 1 | EE | M. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper: A 3-D Circuit Model to evaluate CDM performance of ICs. Microelectronics Reliability 45(9-11): 1425-1429 (2005) |
| 1 | Fred G. Kuper | [1] |
| 2 | Ton J. Mouthaan | [1] |
| 3 | Cora Salm | [1] |
| 4 | Theo Smedes | [1] |
| 5 | M. S. B. Sowariraj | [1] |