| |
| 2002 | ||
|---|---|---|
| 1 | EE | H. V. Nguyen, Cora Salm, R. Wenzel, A. J. Mouthaan, Fred G. Kuper: Simulation and experimental characterization of reservoir and via layout effects on electromigration lifetime. Microelectronics Reliability 42(9-11): 1421-1425 (2002) |
| 1 | Fred G. Kuper | [1] |
| 2 | A. J. Mouthaan | [1] |
| 3 | H. V. Nguyen | [1] |
| 4 | Cora Salm | [1] |