| |
| 2006 | ||
|---|---|---|
| 3 | EE | Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla: A Novel RF Test Scheme Based on a DFT Method. J. Electronic Testing 22(3): 229-237 (2006) |
| 2005 | ||
| 2 | EE | Jee-Youl Ryu, Bruce C. Kim: Low-Cost Testing of 5 GHz Low Noise Amplifiers Using New RF BIST Circuit. J. Electronic Testing 21(6): 571-581 (2005) |
| 1 | EE | Jee-Youl Ryu, Bruce C. Kim: Low-cost test technique using a new RF BIST circuit for 4.5-5.5GHz low noise amplifiers. Microelectronics Journal 36(8): 770-777 (2005) |
| 1 | Bruce C. Kim | [1] [2] [3] |
| 2 | Iboun Taimiya Sylla | [3] |