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| 2006 | ||
|---|---|---|
| 2 | EE | Sani R. Nassif, Vijay Pitchumani, N. Rodriguez, Dennis Sylvester, Clive Bittlestone, Riko Radojcic: Variation-aware analysis: savior of the nanometer era? DAC 2006: 411-412 |
| 1 | EE | N. Rodriguez, J. Adrian, C. Grosjean, G. Haller, C. Girardeaux, A. Portavoce: Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. Microelectronics Reliability 46(9-11): 1554-1557 (2006) |
| 1 | J. Adrian | [1] |
| 2 | Clive Bittlestone | [2] |
| 3 | C. Girardeaux | [1] |
| 4 | C. Grosjean | [1] |
| 5 | G. Haller | [1] |
| 6 | Sani R. Nassif | [2] |
| 7 | Vijay Pitchumani | [2] |
| 8 | A. Portavoce | [1] |
| 9 | Riko Radojcic | [2] |
| 10 | Dennis Sylvester | [2] |