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A. Portavoce

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2006
1EEN. Rodriguez, J. Adrian, C. Grosjean, G. Haller, C. Girardeaux, A. Portavoce: Evaluation of scanning capacitance microscopy sample preparation by focused ion beam. Microelectronics Reliability 46(9-11): 1554-1557 (2006)

Coauthor Index

1J. Adrian [1]
2C. Girardeaux [1]
3C. Grosjean [1]
4G. Haller [1]
5N. Rodriguez [1]

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